Double View Microscope

Model: DCM Series

Manufacturer: Union – Japan

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Overview

DCM-40/60 is a special microscope designed to see if the top and bottom patterns of a wafer are identical with each other. With DCM-40/60, it is possible to  uperimpose the two patterns in one view field (usually on monitor screen) for their comparison. Any differences between them can be easily detected, and the amount of difference can be determined by linear gauge & counter. Objectives are available in various magnifications (5X, 10X, 20X, 40X), making DCM-40/60 applicable to a variety of materials. DCM-40 is for wafers of up to 4 inches. DCM-60 is for wafers of up to 6 inches 

Features

   - Easy alignment of beam axes of upper and lower objectives

   - DCM-40/60 can come with various types of stages.

   - Comes with C mount as standard. TV monitor observation and photographing are possible. (Both CCD video camera and Digital Camera can be used. Digital Camera adaptor is optional)

   - It is possible to observe top or bottom face alone

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Specification

Model DCM-60 DCM-40
Objectives
(To be selected
by customer)
(Total Magnification) (50X) (100X) (200X) (400X)
Top PLM5X PLM10X PLLWDM20X PLLWDM40X
Bottom PLM5X PLM10X PLLWDM20X PLLWDM40X
Eyepiece A pair of SUW10X
(including Micrometer Reticle)
A pair of UW10X
(including Micrometer Reticle)
Total Magnification 50X to 400X (Larger Magnifications are available on custom-order basis.)
Travel Distance of Upper Objective 24mm 30mm
Travel Distance of Lower Objective 3mm 12mm
Filter Top:Green / Bottom:Red
Stage & Counter 150 x 150mm Manual Stage
KC-12R Counter (1μm reading)
50 x 50mm Manual Stage, Digital Micrometer (1μm reading) 100 x 100mm Manual Stage, KC-12R Counter (1μm reading)
Stage Travel X : 150mm Y : 150mm X : 50mm Y : 50mm
X : 100mm Y : 100mm
Wafer Holder Maximum : 6 inches Maximum : 4 inches
Holder can be supplied in specially designed shape on custom-order basis.
Stage Rotation 360°
Illumination 150W Halogen Light Guide Illumination
Thickness of Material 20mm or less 30mm or less
Type of Calibration Chart Calibration Chart for Optical Axis Alignment
Measuring Method

Four Simple Steps:

1. Set OPTICAL AXIS switch to Top & Bottom. Align the optical axes of upper and lower objectives with calibration chart.

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2. Place wafer on wafer holder. Set OPTICAL AXIS switch to Top. Focus on the top surface.

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3. Set OPTICAL AXIS switch to Bottom. Focus on the bottom surface.

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4. Set OPTICAL AXIS switch to Top & Bottom. See if the two patterns completely fuse into one image. Determine the amount of dislocation, if any, with linear gauge & counter, or with micrometer reticle of eyepiece.

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